Line x Tester Analysis for Combining Ability in Sorghum
M. U. Kukadia
Jowar Research Scheme, GAU, Surat-395 007
Corresponding author
K. B. Desai
Jowar Research Scheme, GAU, Surat-395 007
M. S. Desai
Jowar Research Scheme, GAU, Surat-395 007
R. H. Patel
Jowar Research Scheme, GAU, Surat-395 007
V. K. Gupta
Jowar Research Scheme, GAU, Surat-395 007
Abstract
Two-factor mating design using line x tester analysis was adopted involving four male-sterile as lines and six pollen-parents as testers. Both additive as well as non- additive gene effects were important for inheritance of grain yield. 2219 A and IS 370 were good combiners for yield. Better transgressive segregates are expected from the hybrids for one or another character.