Genetic parameters and character associations for yield and yield contributing traits in dual sorghum (Sorghum bicolor L. Moench) 

Abstract

Thirty two advanced dual sorghum genotypes were evaluated at Sorghum Research Station, S. D. Agricultural Univeristy, Deesa during Kharif 2015 to study the genetic variability and genetic association for grain yield, fodder yield and their component characters. Both genotypic and phenotypic variances were highly significant in all the traits with little higher phenotypic variations as usual. Similarly, the low differences between the phenotypic and genotypic coefficients of variations indicated low environmental influences on the expression of these characters. High heritability coupled with high genetic advance in % of mean was obtained with panicle length, leaf length, leaf width, plant height, grain yield and fodder yield. Genotypic correlation coefficients were higher than the corresponding phenotypic correlation coefficients in most of the traits. Plant height, number of leaves/plant, leaf length, leaf width and days to maturity were the most important characters which possessed positive association with fodder yield. While panicle length was positively and significantly associated with grain yield. Path coefficient analysis revealed that among the different yield contributing characters fodder yield, panicle length and leaf length influenced grain yield directly while leaf width, number of leaves/plant, plant height, days to maturity and grain yield influenced fodder yield directly. The direct effects of these characters on grain yield and fodder yield were positive and considerably high. Thus the plant selection based on these traits will be most effective in the development of dual sorghum varieties.